Özgün Attila

PhD Candidate

Employed since: March 2014
E-mail: o.attila (at) uu.nl
Room: 5th floor study area

My project aims to increase the fundamental understanding of crystalline porous materials by using micro- and nano-spectroscopy techniques.
Scanning Probe Microscopy (SPM) is a method of microscopy that images the surface of the specimen even in atomic resolutions [1, 2]. Combinations of various SPM techniques such as Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM) can give more detailed information about the specimen used. In my research, I aim to design probes for combined AFM/STM operations to reach higher resolution images.
I also work on the characterization of the catalytic solids by Secondary Ion Mass Spectrometry (SIMS) technique in nanoscale. This technique is sputtering the surface of the samples with a focused primary ion beam and collecting and analyzing ejected secondary ions. By this method I aim to analyze the composition of the micro porous materials in nanoscale.
Synchrotron based X-ray microscopy is an important method for analyzing the chemical properties of a specimen by using a powerful radiation source [3]. My project also contains using methods such as X-ray Tomography and X-ray Absorption Near Edge Structure (XANES) in order to learn elemental specificity both inner and outer surface of the catalytic solids.
 
[1] Binnig G., Quate C. F., Gerber C. (1986) Atomic force microscope. Physical Review Letters. 56 (9), pp. 930–933
[2] Binnig G., Rohrer H., Gerber C., Weibel E. (1982) Surface Studies by Scanning Tunneling Microscopy. Physical Review Letters., (49), pp. 57-61
[3] Saisho H.,Gohshi Y. (1996) Applications of Synchrotron Radiation to Materials Analysis. Amsterdam: Elsevier