My project aims to increase the fundamental understanding of crystalline porous materials by using micro- and nano-spectroscopy techniques.
Scanning Probe Microscopy (SPM) is a method of microscopy that images the surface of the specimen even in atomic resolutions [1, 2]. Combinations of various SPM techniques such as Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM) can give more detailed information about the specimen used. In my research, I aim to design probes for combined AFM/STM operations to reach higher resolution images.
I also work on the characterization of the catalytic solids by Secondary Ion Mass Spectrometry (SIMS) technique in nanoscale. This technique is sputtering the surface of the samples with a focused primary ion beam and collecting and analyzing ejected secondary ions. By this method I aim to analyze the composition of the micro porous materials in nanoscale.
Synchrotron based X-ray microscopy is an important method for analyzing the chemical properties of a specimen by using a powerful radiation source . My project also contains using methods such as X-ray Tomography and X-ray Absorption Near Edge Structure (XANES) in order to learn elemental specificity both inner and outer surface of the catalytic solids.
 Binnig G., Quate C. F., Gerber C. (1986) Atomic force microscope. Physical Review Letters. 56 (9), pp. 930–933
 Binnig G., Rohrer H., Gerber C., Weibel E. (1982) Surface Studies by Scanning Tunneling Microscopy. Physical Review Letters., (49), pp. 57-61
 Saisho H.,Gohshi Y. (1996) Applications of Synchrotron Radiation to Materials Analysis. Amsterdam: Elsevier